ThinFilmCharacterization

Angular spectrum approach to inverse synthesis for the characterization of optical and geometrical properties of semiconductor thin films

John Bass, Manuel Ballester, Susana M Fernández, Aggelos K Katsaggelos, Emilio Márquez, Florian Willomitzer

Characterizing optical and geometrical properties of semiconductor thin films with a split-step angular spectrum approach to inverse synthesis

John Bass, Manuel Ballester, Susana M. Fernández, Aggelos K. Katsaggelos, Emilio Márquez, Florian Willomitzer

Enhancing the Swanepoel method: precise envelope detection of thin-film transmission spectra

Manuel Ballester, Almudena P Márquez, Santiago Lopez-Tapia, Susana Fernandez, John Bass, Dorian Minkov, Christoph Wuersch, Florian Willomitzer, Emilio Márquez, Aggelos K Katsaggelos

Increasing the Precision of Transmission Spectroscopy by Optimization of Thin Film Surface Shapes

John Bass, Manuel Ballester, Susana M Fernández, Aggelos K Katsaggelos, Emilio Márquez, Florian Willomitzer

Optical Characterization of Thin Films from Transmission Data using Deep Learning

Manuel Ballester, Christoph Würsch, Emilio Márquez, Florian Willomitzer, AK Katsaggelos

Review and novel formulae for transmittance and reflectance of wedged thin films on absorbing substrates

Manuel Ballester, Emilio Márquez, John Bass, Christoph Würsch, Florian Willomitzer, Aggelos K Katsaggelos

Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated a-Si

Manuel Ballester, Almudena P. Márquez, Concepción Garcı́a-Vázquez, José Manuel Díaz Moreno, Eduardo Ollero Blanco, Dorian Asenov Minkov, Susana M. Fernández-Ruano, Florian Willomitzer, Oliver Cossairt, Emilio Márquez