Complementary Characterization of Polycrystalline Copper-Nitride Films by UV-MIR (0.2-40 $μ$m) Ellipsometry and FIB-SEM Microscopy

Publication
Preprint
Manuel Ballester
Manuel Ballester
Ph.D. Candidate in Electrical and Computer Engineering
Florian Willomitzer
Florian Willomitzer
Associate Professor of Optical Sciences