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Complementary Characterization of Polycrystalline Copper-Nitride Films by UV-MIR (0.2-40 $μ$m) Ellipsometry and FIB-SEM Microscopy
Emilio Márquez
,
Eduardo Blanco
,
J Manuel Mánuel
,
Manuel Ballester
,
Marcos Garcı́a-Gurrea
,
Susana Fernandez
,
Mar\' ́Isabel Rordr\ǵuez-Tapiador
,
Florian Willomitzer
,
Aggelos K Katsaggelos
January 2023
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Cite
DOI
Type
Journal article
Publication
Preprint
Manuel Ballester
Ph.D. Candidate in Electrical and Computer Engineering
Florian Willomitzer
Associate Professor of Optical Sciences
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