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Emilio Márquez

Characterizing optical and geometrical properties of semiconductor thin films with a split-step angular spectrum approach to inverse synthesis
Enhancing the Swanepoel method: precise envelope detection of thin-film transmission spectra
An angular spectrum approach to inverse synthesis for the characterization of optical and geometrical properties of semiconductor thin films
Increasing the Precision of Transmission Spectroscopy by Optimization of Thin Film Surface Shapes
Optical Characterization of Thin Films from Transmission Data using Deep Learning
Review and novel formulae for transmittance and reflectance of wedged thin films on absorbing substrates
Complementary Characterization of Polycrystalline Copper-Nitride Films by UV-MIR (0.2-40 $μ$m) Ellipsometry and FIB-SEM Microscopy
Deep Learning Method to Find Swanepoel Envelopes in Transmission Spectroscopy
Deep Learning Method to Find Swanepoel Envelopes in Transmission Spectroscopy
Mid-Infrared Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity
Application of the holomorphic tauc-lorentz-urbach function to extract the optical constants of amorphous semiconductor thin films
Comparison of optical characterization methods for transmission spectroscopy
Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated a-Si

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