Search

Eduardo Blanco

Complementary Characterization of Polycrystalline Copper-Nitride Films by UV-MIR (0.2-40 $μ$m) Ellipsometry and FIB-SEM Microscopy
Mid-Infrared Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity
Application of the holomorphic tauc-lorentz-urbach function to extract the optical constants of amorphous semiconductor thin films

Published with Wowchemy — the free, open source website builder that empowers creators.