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Aggelos K Katsaggelos

Enhancing the Swanepoel method: precise envelope detection of thin-film transmission spectra
An angular spectrum approach to inverse synthesis for the characterization of optical and geometrical properties of semiconductor thin films
Increasing the Precision of Transmission Spectroscopy by Optimization of Thin Film Surface Shapes
Review and novel formulae for transmittance and reflectance of wedged thin films on absorbing substrates
Complementary Characterization of Polycrystalline Copper-Nitride Films by UV-MIR (0.2-40 $μ$m) Ellipsometry and FIB-SEM Microscopy
Deep Learning Method to Find Swanepoel Envelopes in Transmission Spectroscopy
Deep Learning Method to Find Swanepoel Envelopes in Transmission Spectroscopy
Mid-Infrared Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity
Application of the holomorphic tauc-lorentz-urbach function to extract the optical constants of amorphous semiconductor thin films
Comparison of optical characterization methods for transmission spectroscopy
Skinscan: 3D Dermatologic Diagnosis and Documentation with Commodity Devices
Fast simulations in Computer-Generated Holograms for binary data storage
Skinscan: Low-cost 3d-scanning for dermatologic diagnosis and documentation
Speckle based Extended Depth-of-Field for Macroscopic Imaging: First results
Time-domain optical coherence tomography can measure artworks with high penetration and high resolution

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